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在实际工作中,需要对样品中存在的微量物质进行定量分析。由于待测相在试样中含量少,它在X射线衍射图谱上峰的强度很小。这必然给分析带来一定的困难,并会引起较大的误差。为解决这个问题,我们提出一种新的、对待测的微量物质增量的X射线分析方法。设分析样品的总重量为W,其中待测相重量为W_A,参考物质重量为W_S,增量的待测相物质重量为W’_A,待测相的百分含量为
In practice, the trace substances present in the sample need to be quantitatively analyzed. Due to the low content of the phase to be measured in the sample, the intensity of the peak on the X-ray diffraction pattern is small. This inevitably brings certain difficulties to the analysis and causes great errors. In order to solve this problem, we propose a new X-ray analysis method to measure the increment of trace substances. Assume that the total weight of the sample to be analyzed is W, wherein the weight of the phase to be measured is W_A, the weight of the reference material is W_S, the mass of the substance to be measured in increments is W’_A, the percentage of the phase to be measured is