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采用位置接力法和HPGeγ谱仪跟踪测量132I的半衰期。位置之间的交替测量避免了效率刻度,设定每次跟踪测量的真时间相等,简化数据处理,并用平移和迭代两种方法进行数据处理。实验测得132I的半衰期为(2.283±0.002)h,经检验数据可靠。
The half-life of 132I was tracked by location relay and HPGe gamma spectrometer. Alternate measurements between locations avoid efficiency scaling, set true tracking times equal to each other, simplify data processing, and perform data processing using both translation and iteration methods. The half-life of 132I measured by the experiment was (2.283 ± 0.002) h, and the test data were reliable.