针对数字电路板中含ROM和RAM芯片电路板故障诊断难的现状,采用器件等效模型方法和改进的组合时序电路测试生成算法,研制开发了一套支持ROM/RAM器件测试生成、集电路模型输入、测试生成算法、故障仿真及IEEE-1445标准测试数据转换功能于一体的数字电路板故障诊断测试数据自动生成系统,应用结果表明,该系统测试生成效率高、故障诊断精度高,具有一定的实用性和推广价值。 Aiming at the current situation of circuit board fault diagnosis of ROM and RAM chips in digital circuit boards, a device equivalent model method and an improved combination circuit test generation algorithm are used. A set of test generation and ROM Input, test generation algorithm, fault simulation and IEEE-1445 standard test data conversion functions in one digital circuit board fault diagnosis test data automatic generation system, the application results show that the system test with high efficiency, fault diagnosis accuracy, with a certain Practicality and promotion value.