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由中国电子学会RQC学会、航空航天部半导体器件失效分析中心与机电部军工电子可靠性管理办公室联合举办的1991年全国可靠性物理学术讨论会于1991年11月1日至5日在上海召开。 会议特邀日本著名可靠性专家吉田弘之发表两篇论文,并与会议代表座谈。 会议还聘请我国有关专家从来稿中精选出论文60篇,其中我部占36％。 经过投票初评和专家复评,会议最后评出优秀论文6篇。
The 1991 National Symposium on Reliability Physics jointly organized by the RQC Society of the Chinese Institute of Electronics, the Semiconductor Device Failure Analysis Center of the Aerospace Department and the Military Electronic Reliability Management Office of the Ministry of Machinery and Electronics was held in Shanghai from November 1st to 5th, 1991. The meeting specially invited Japan’s famous reliability expert Yoshida Yoshida to publish two papers and hold discussions with representatives of the conference. The meeting also hired relevant experts from China to select 60 papers from the manuscripts, of which the Ministry of China accounts for 36%. After the preliminary evaluation of the voting and the review of the experts, the final 6 excellent papers were selected.