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一、引 言 大规模集成电路测试设备的核心是测试图案发生器.为发展我国大规模集成电路的测试设备,我们对于测试图案的产生方法进行了研究,提出了几点看法并用于研制大规模集成电路设备的实践.与北京无线电仪器厂合作研制了:
I. INTRODUCTION At the heart of large scale integrated circuit test equipment is the test pattern generator. In order to develop test equipment for large scale integrated circuits in China, we have studied the generation of test patterns, put forward some ideas and used them to develop large scale integrated circuits Circuit equipment practice. Cooperation with Beijing Radio Instrument Factory developed: