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本文阐述用扫描探针显微技术获取样品表面功函数、局域态密度以及原子表观半径的基本理论和方法，提出了根据这些表面信息进行原子识别的基本思想。
This paper describes the basic theory and method of acquiring the surface work function, local density of states and atomic apparent radius by scanning probe microscopy, and presents the basic idea of atomic recognition based on these surface information.