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提出一种表征硅表面有机单分子膜的新方法界面微分电容测量法 .通过对新制备的 H-Si( 1 1 1 )表面和一系列烯烃分子修饰的硅表面 /电解液界面的微分电容的研究 ,建立了硅表面有机膜结构和性质与界面电容之间的联系 .实践证明这是一个简便、快速和有效的实验技术 ,为硅表面化学修饰与功能化研究提供了一个非常有力的工具 .
A new method of interfacial differential capacitance measurement is proposed to characterize the surface organic monolayer on silicon surface. The differential capacitance between the newly prepared H-Si (1 1 1) surface and a series of alkene modified silicon surface / electrolyte interface It is proved that this is a simple, rapid and effective experimental technique, which provides a very powerful tool for the chemical modification and functionalization of silicon surface.