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垂直磁记录是一种高密度的磁记录方式.从实用的角度出发,逢坂弥哲在1981年提出了用化学镀方法制备CoNiMnP垂直磁化膜;薄膜的磁结构对其磁记录性能具有直接影响.磁力显微镜(MFM)是扫描探针显微术(SPM)的一种,通过控制磁性针尖在样品表面的扫描可获得表面磁场信息,它被较多地应用于研究磁头和磁盘或其他存储介质上的数据位结构,例如数据位的大小和形状、介质噪音、重写和材料承受高密度存储的能力,获得有关磁头性能及存储介质质量的的信息,分辨率优于25nm.MFM的一个主要优点是不需要特殊的样品制备技术,甚至样品表面可以裹镀非磁性薄层.我们根据多年研究制定的工艺参数,镀制了几种不同的CoNiMnP膜,对其形貌、磁性能等作了观察和分析,并用MFM观察和分析了这
Vertical magnetic recording is a high-density magnetic recording method.From a practical point of view, Fosan Sakamoto proposed in 1981 the use of electroless plating method to prepare CoNiMnP perpendicular magnetization film; magnetic structure of the film has a direct impact on its magnetic recording performance. Magnetic force microscopy (MFM) is a kind of scanning probe microscopy (SPM). The surface magnetic field information can be obtained by controlling the scanning of the magnetic tip on the sample surface. It is widely used in the research of heads and disks or other storage media Data bit structures such as the size and shape of the data bits, media noise, overwriting, and the ability of the material to withstand high-density storage for better information on head performance and the quality of the storage media at resolutions better than 25 nm. One of the major advantages of MFM No special sample preparation technology is required, and even the sample surface can be coated with non-magnetic thin layer.We made several different CoNiMnP films according to the process parameters developed for many years and observed their morphology and magnetic properties And analyzed and observed and analyzed with MFM