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由于X-射线衍射理论和技术的发展,加之使用已建立的扩散模型,现已能使转变或反应过程的静态速率控制参数得以十分简便地测定。本文简要地叙述了动力学测定技术及数据分析程序。根据动力学数据,获取互扩散系数的方法有两种:正空间法和倒易空间法。为了表明这种分析的有效性,文中列举了三个实例:硅上Pd_2Si层的增长动力学、过饱和Ni-Si合金分解动力学以及不规则固溶体的短程有序。
Due to the development of X-ray diffraction theory and technology, combined with the established diffusion model, the static rate control parameters of the transition or reaction process have now been determined very conveniently. This article briefly describes kinetic determination techniques and data analysis procedures. According to the kinetic data, there are two ways to obtain the mutual diffusion coefficient: the positive space method and the reciprocal space method. In order to demonstrate the validity of this analysis, three examples are cited: growth kinetics of Pd_2Si layer on silicon, decomposition kinetics of supersaturated Ni-Si alloy, and short-range order of irregular solid solution.