19F+27Al耗散反应产物截面测量中的不重复性

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在中国原子能科学研究院的HI-13串列静电加速器上完成了114MeV和118.75MeV的19F+27Al耗散反应产物B,C,N,O,F,Ne,Na和Mg的微分截面测量.条形27Al同位素靶的大小尺寸为10mm×50mm,平均厚度约67μg/cm2.固定入射束流19F的能量,通过移动靶位,先后轰击了靶上20个不同的位置.实验结果表明,在弹靶系统、入射能量以及探测系统都相同的多次独立的微分截面测量中,截面的涨落不呈现高斯型几率分布.截面测量的这种不重复现象难以用有限计数率的统计性质来解释.
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