电子技术的飞跃发展,使各种IC层出不穷,为使用提供了很大的选择余地,方便了各类电子产品的设计,但是,也为IC的检测和选购带来了一些新问题。 一、如何判断IC的好坏 判断IC的好坏,主要以其相关引脚的电压、在路电阻及实际功能是否正常为依据,必要时可用替代法验证其好坏。 二、集成电路的测试方法 通常有电压测试法、电阻测试法、电流测试法、干扰测试法、代替测试法,其中前两种是主要的。 1.电压测试法 这种方法主要是通过检测电路中有关测试点的工作电压来判断IC工作是否正常。可以用万用表直流电压挡的适 The rapid development of electronic technology, so that all kinds of IC after another, for the use of providing a great choice, to facilitate the design of all types of electronic products, but also for the IC testing and purchase brings some new problems. First, how to determine the quality of the IC to determine the quality of the IC, mainly related to its pin voltage, the road resistance and the actual function is normal, if necessary, alternative method can be used to verify its good or bad. Second, the integrated circuit test methods are usually voltage test method, resistance test method, current test method, interference test method, instead of test method, of which the first two are the main. 1. Voltage Test Method This method is mainly through the detection circuit test points on the working voltage to determine whether the work of IC is normal. DC voltage can be blocked with a multimeter suitable