16-18 August 2007,Xi An,China Sponsor:Chinese Institute of Electronics (CIE)Technical Co-sponsor:IEEE Beijing Section Supporters:National Natural Science Foundation of ChinaChina Instrument & Control Society China Society for Measurement University of Hong Kong Computer Measurement Group(US)Silicon Valley Science and Technology Association (US)Organizers:Measurement and Instruments Society of CIE Xi’ An University of Technology Journal of Electronic Measurement and InstrumentWe are delighted to announce that the 8th International Conference on Electronic Measurement & Instruments (ICEMI’2007) will be held on 16-18 August 2007 in Xi’An, China. ICEMI is the world’s premier conference dedicated to the electronic test of devices, boards and systems—covering the complete cycle from design verification, test, diagnosis, failure analysis and back to process and design improvement, and is convened every two years. The purpose of the ICEMI is to provide excellent opportunities for scientists, engineers, and participants throughout the world to present the latest research results and to exchange their views or experience. Prospective authors are invited to submit original, unpublished papers in any of the following areas: 16-18 August 2007, Xi An, China Sponsor: Chinese Institute of Electronics (CIE) Technical Co-sponsor: IEEE Beijing Section Supporters: National Natural Science Foundation of China China Instrument & Control Society China Society for Measurement University of Hong Kong Computer Measurement Group (US) Silicon Valley Science and Technology Association (US) Organizers: Measurement and Instruments Society of CIE Xi ’An University of Technology Journal of Electronic Measurement and InstrumentWe are delighted to announce that the 8th International Conference on Electronic Measurement & Instruments (ICEMI’ 2007 ) will be held on 16-18 August 2007 in Xi’An, China. ICEMI is the world’s premier conference dedicated to the electronic test of devices, boards and systems-covering the complete cycle from design verification, test, diagnosis, failure analysis and back to process and design improvement, and is convened every two years. The purpose of the ICEMI is to provide excellent opportunities for scientists, engineers, and participants throughout the world to present the latest research results and to exchange their views or experience. Prospective authors are invited to submit original, unpublished papers in any of the following areas: