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因PCB上微带线(MSL)与外界电磁能量耦合而生成感应电流(Current),会对敏感器件造成耦合伤害。而目前对此研究的关注度不够,故以带拐角MSL的PCB板内置于开孔屏蔽腔为研究对象,以Current计算为主要切入点,进行多参数耦合特性计算。先建立相应数值模型并验证建模方法有效性后,外置平面波激励源,利用有限元法考察不同计算位置、有无屏蔽腔、MSL夹角大小及拐角补偿等参数变化对电流的影响。结果表明:直MSL上不同计算位置对Current影响不大,其数值都要比MSL弯折时要大,两者差值随频率增加而逐渐减小;谐振点处腔体抑制效果会被弱化甚至完全失效;MSL与电场E平行放置时,迹线需布成短线,MSL与电场E垂直放置时,迹线可布成长线;MSL宽度增加,电流数值会增加但趋势减缓。拐角补偿方法对提高信号完整性(SI)有效,但对降低电磁耦合作用有限。不会影响谐振点出现位置是上述多参数研究的共性结果。
The induced current (Current) generated by coupling the microstrip line (MSL) on the PCB with the external electromagnetic energy can cause coupling damage to the sensitive device. At present, the concern about this research is not enough, so the PCB with corner MSL is built in the aperture shielding cavity as the research object, and Current calculation is taken as the main entry point to calculate the multi-parameter coupling characteristics. After establishing the corresponding numerical model and validating the validity of the modeling method, the external planar wave excitation source is used to investigate the influence of the change of parameters such as different calculated positions, unscreened cavity, MSL included angle and corner compensation on the current by finite element method. The results show that the direct calculation of the MSL has little effect on Current, and its value should be larger than that of the MSL. The difference between the two decreases with the increase of the frequency. At the resonance point, the inhibition effect of the cavity will be weakened or even reduced Completely invalidated. When the MSL is placed in parallel with the electric field E, the traces need to be distributed in short lines. When the MSL and the electric field E are placed vertically, the traces can be made into long lines. When the MSL width increases, the current value increases but the trend decreases. Corner compensation methods are effective for improving signal integrity (SI) but have a limited effect on reducing electromagnetic coupling. Will not affect the location of resonance point is a common result of the above multi-parameter study.