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利用各样本点 PSPICE模拟结果 ,结合重要参数抽样技术 ,提出了一种有效的集成电路成品率优化新方法 ,通过对 CMOS集成运放的成品率优化证明了该方法的有效性和实用性
Based on the PSPICE simulation results of each sample point and the sampling technique of important parameters, an effective new method for yield optimization of integrated circuits is proposed. The yield and efficiency of CMOS integrated operational amplifier are optimized to prove the effectiveness and practicability of this method