自动微分 (AD)技术以非标准分析为理论基础 ,是计算机数值计算领域中的一种很有前途的方法。文中提出了基于 AD技术的器件模型参数提取算法 ,在 Visual C+ +平台编制了模型参数提取程序 ,对所建立的基于表面势的 MOSFET模型进行了有约束条件的参数提取。结果表明 ,算法收敛快、稳定性好、提取准确 Automatic differential (AD) technology to non-standard analysis as the theoretical basis, is a computer numerical calculation in the field of a promising method. In this paper, a parameter extraction algorithm of device model based on AD technology is proposed. The program of model parameter extraction is programmed on Visual C + + platform, and parameters of the established MOSFET model based on surface potential are constrained. The results show that the algorithm converges quickly and has good stability and accurate extraction