X射线荧光层析技术是利用内壳层电子跃迁所发出荧光辐射,来测定样品中的元素含量,获取样品内部的结构信息。Wolter型掠入射镜装置的元素灵敏度可以达到106个原子／cm3,空间分辨率达到微米量级。结合康普顿散射和吸收层析进行成像可使其图像质量得到进一步的提高。而当获得了物体的投影数据以后,可采用各种重建算法来使物体得以准确重现。介绍了几种常用的重建算法,并就其特点进行了比较。 X-ray fluorescence tomography is the use of fluorescence emission emitted by the electronic transition of the inner shell to determine the elemental content in the sample and obtain the structural information inside the sample. Wolter type grazing incidence of the mirror device element sensitivity can reach 106 atoms / cm3, the spatial resolution of the order of microns. The combination of Compton scattering and absorption tomography can further improve the image quality. When the projection data of the object is obtained, various reconstruction algorithms can be used to make the object accurately reproduce. Several commonly used reconstruction algorithms are introduced and their characteristics are compared.