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1 前言现在MOS存储器已成为存储元件的主流,许多单位在研制和出售各种形式的MOS存储器。现在讨论一下在某个装置中,采用这样的新品种MOS存储器的情况下,从厂家抽样购买准备选用的固体电路(IG)再从用户的角度进行种种评价试验,判断是否适于采用。这种评价试验大体上分为DG试验和容限试验等的电气特性的评价与环境试验和寿命试验等的可靠性评价两种。本文主要介绍有关电特性评价的测试方法,进而基于这种测试方法对验收检查方法也做一简单介绍。
1 Introduction MOS memory has now become the mainstream of storage devices, many units in the development and sale of various forms of MOS memory. Now, in the case of using such a new type of MOS memory device in a certain device, it is judged whether or not it is suitable for adoption by purchasing a sample of a commercially available solid-state circuit (IG) from a manufacturer and carrying out various evaluation tests from the user’s point of view. This type of evaluation test is broadly classified into two types of evaluation of the electrical characteristics such as the DG test and the margin test, and the reliability evaluation of environmental tests and life tests. This article mainly introduces the test method of the evaluation of the electrical characteristics, and then based on this test method of acceptance inspection method is also made a brief introduction.