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研究物质的取样属性与取样误差之间的关系是分析化学取样学的重要内容.从微观角度探讨了物质的理化性质及其对取样误差的影响.以碳化硅为例,考察了粒度分布、组分随粒度的变化以及均匀度因子等,分析了取样误差的来源.首次通过粒度分级成功地对碳化硅进行了分层,并对分层取样和随机取样的误差进行了分析和讨论,为制定合理的取样方案提供了有利的依据.本文的研究方法可适用于所有粒状物质的取样,同时也为分析化学取样学的深入研究拓宽了方向.
The relationship between the sampling attributes and the sampling errors of the studied substances is an important part of the analytical chemistry sampling.The physical and chemical properties of the materials and their effects on the sampling errors are discussed from the microscopic point of view.With silicon carbide as an example, Points with the particle size changes and evenness factor analysis of the source of sampling error for the first time through the particle size grading of silicon carbide layering has been carried out and stratified sampling and random sampling errors were analyzed and discussed in order to develop A reasonable sampling program provides a favorable basis.The research method of this paper can be applied to all the granular material sampling, but also for the analysis of chemical sampling to further the direction of research.