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用旋涂法制备了双吡咯烷酮为核的联噻吩衍生物(Diketopyrrolopyrrole-containing Oligothiophene,SMDPPEH)薄膜,并采用紫外-吸收光谱和掠入射X射线衍射方法研究了热退火过程中的微结构变化。原位热退火的紫外-吸收光谱结果表明,100?C及以上时,第二个和第三个最大吸收峰发生蓝移。掠入射X射线衍射结果表明SMDPPEH薄膜在100?C左右退火时有相变产生,并且随退火温度升高,薄膜的结晶度在增大。相应处理后的SMDPPEH薄膜的紫外-吸收光谱和掠入射X射线衍射证明了SMDPPEH薄膜这个相变保留到了降温后的薄膜中。
Diketopyrrolopyrrole-containing Oligothiophene (SMDPPEH) thin films were prepared by spin coating. The microstructure changes during thermal annealing were investigated by UV-absorption spectroscopy and grazing incidence X-ray diffraction. UV-IR spectra of in-situ thermal annealing show that blue shift occurs at the second and third maximum absorption peaks at 100 ◦ C and above. Grazing incidence X-ray diffraction results show that SMDPPEH films annealed at about 100? C phase transition occurred, and with the annealing temperature increases, the film crystallinity increases. UV-absorption spectra and grazing incidence X-ray diffraction of the correspondingly treated SMDPPEH film demonstrate that the SMDPPEH film retains its phase transition in the cooled film.