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基于静态随机存储器的现场可编程逻辑门阵列应用于航天电子系统时,易受到单粒子翻转效应的影响,存储数据会发生损坏。为评估器件和电路在单粒子翻转效应下的可靠性,提出一种基于TCL脚本控制的故障注入系统,可在配置码流层面模拟单粒子翻转效应。介绍了该故障注入系统的实现机制和控制算法,并将该软件控制方法与传统硬件控制方法进行对比分析。设计了一种关键位故障模型,从设计网表中提取关键位的位置信息,缩小了故障注入的码流范围。在Virtex-5开发板XUPV5-LX110T上的故障注入实验表明,该故障注入系统能有效模拟单粒子翻转效应,与传统随机位故障注入相比,关键位故障注入的故障率提高了近5倍。
Field programmable gate arrays based on static random access memory (SRAM) are susceptible to single-event flip-flop effects when applied to aerospace electronics systems and data corruption can occur. To evaluate the reliability of the device and the circuit under the single-event flip-flop effect, a fault injection system based on TCL script control is proposed to simulate the single-event flip-flops at the configured bitstream level. The implementation mechanism and control algorithm of the fault injection system are introduced, and the software control method and the traditional hardware control method are compared and analyzed. A key bit failure model is designed. The key bit location information is extracted from the design netlist to reduce the range of bitstreams injected into the fault. Fault injection experiment on Virtex-5 development board XUPV5-LX110T shows that the fault injection system can effectively simulate the single-particle inversion effect. Compared with the traditional random-bit fault injection, the failure rate of critical bit injection is increased by nearly 5 times.