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本文研究直接从衰减频率特性设计系统或仪表的校正装置的方法。由频率特性或根轨迹按照一定稳定裕度设计校正装置的方法早在30多年以前已研究得非常充分,并获得广泛的应用。本文提出的直接设计方法是一种新的概念,通过预期的调节时间t_s和预期的波动度m直接确定校正装置的模式和结构参数,其特点是指标明确、方法简单、便于计算,尤其是串?校正时,这些优点更为显著。本文是作者在研究衰减状态下频率特性或对象模型基础上提出的一种新的设计方法,着重介绍这方法的原理、计算公式与应用。
This article studies ways to design a system or instrumentation calibration device directly from the attenuation frequency characteristics. The method of designing a correction device with a certain stability margin based on frequency characteristics or root locus has been studied sufficiently well over 30 years ago and has been widely used. The direct design method proposed in this paper is a new concept that directly determines the modalities and structural parameters of the correction device by the expected adjustment time t_s and the expected degree of fluctuation m. The method is characterized by a clear index, a simple method and easy calculation, These advantages are even more significant when calibrating. This article is a new design method proposed by the author on the basis of studying the frequency characteristics or object model under the attenuation state, and emphatically introduces the principle, calculation formula and application of this method.