本文简单介绍了一个SN74系列中规模集成电路优化测试码生成系统。该系统由三部分构成。测试码生成部分——生成电子的全部测试码;故障模拟部分——得出故障字典(测试码与所测故障的对应关系);优化部分——从全部测试码中挑出能复盖电路中全部故障且个数最少的测试集。该系统已可提供使用。 This article briefly introduces a SN74 series of large scale integrated circuit optimization test code generation system. The system consists of three parts. Test code generation part - generate all the test code of the electronic; fault simulation part - get the fault dictionary (test code and the measured fault correspondence); optimization part - pick from all the test code can cover the circuit All failures and the smallest number of test sets. This system is already available for use.