论文部分内容阅读
本文主要是论述适用于电容器用有机薄膜高温ε-tgε的测量方法——“高温液体排代法”。其中详细说明了此法提出的必要性、主要依据、基本原理、计算公式及准确测量的必要条件。同时也对 F-4膜在200℃下进行测量的电极装置,所用的高温媒质、实用测试条件、操作中应注意的事项和测试结果分析等,均作了全面介绍。证明这确实是一种目前在高温下不必测量薄膜厚度就可得到薄膜的ε和 tgδ的准确值的一种切实可行的简便方法。
This paper mainly discusses the measurement method of high temperature ε-tgε for organic thin films used in capacitors - “high temperature liquid displacement method”. It details the necessity, the main basis, the basic principle, the calculation formula and the necessary conditions for accurate measurement. At the same time, the electrode device, the high temperature medium used, the practical test conditions, the matters needing attention in the operation and the analysis of test results of the F-4 membrane at 200 ℃ were also introduced. It turns out to be a practical and easy way to obtain the exact values of ε and tgδ for films without the need to measure the film thickness at high temperatures.