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利用同位素X荧光谱线解析法分析萃取过程单一稀土元素的含量。使用放射源(241)Am激发稀土元素的K系荧光.用高分辨半导体探测器直接测定槽体的全部稀土元素谱线,通过多道脉冲分析器获取X荧光能谱。由于各稀土元素有其特征荧光能量,通过能量峰位值鉴别元素的种类,经过对谱线的解析处理最终求出峰的净面积,从而给出相对含量(利用自行设计分析软件IXRF)。通过微机解谱、处理数据.由所分析结果得到:小于58/l浓度时分析误差小于20%;大于10g/l分析误差小于10%。本工作是为稀土萃取过程在线分析所完成的实验室阶段任务,从分析结果看可以满足在线分析的技术要求。
Analysis of Single Rare Earth Elements in Extraction Process by Isotope X - ray Fluorescence Spectroscopy. The K-type fluorescence of rare earth elements is excited by a radioactive source (241) Am, the total rare earth element spectrum of the bath body is directly measured by a high-resolution semiconductor detector, and the X-ray fluorescence spectrum is obtained by a multi-channel pulse analyzer. Because each rare earth element has its characteristic fluorescence energy, the elemental types of the energy peak value are identified, and the net area of the peak is finally calculated by analyzing the spectral line, thereby giving the relative content (utilizing the self-designed analysis software IXRF). Through computerized spectroscopy, the data were processed.The results of the analysis showed that: the analysis error was less than 20% when the concentration was less than 58/1; the analysis error was less than 10% when the concentration was more than 10g / l. This work is a laboratory phase task completed for on-line analysis of rare earth extraction process, which can meet the technical requirements of online analysis from the analysis results.