采用互谱估计方法测量了半导体激光器的微弱电噪声谱及光噪声谱。结果表明两者在超辐射区有较强的相关性。对光噪声的形成机理分析证明由载流子起伏形成的光噪声与电噪声完全相关，而由外量子效率起伏引起的光噪声与电噪声是不相关的。 The cross-spectral estimation method was used to measure the weak electric noise spectrum and optical noise spectrum of the semiconductor laser. The results show that the two have a strong correlation in the super-radiation zone. The formation mechanism analysis of optical noise proves that the optical noise formed by the carrier fluctuation is completely related to the electrical noise, while the optical noise caused by the fluctuation of the external quantum efficiency is not related to the electrical noise.