论文部分内容阅读
本文用微区共聚焦荧光光学显微镜在垂直于氧化锌微米线c轴的方向测量微米线上不同位置的光谱,通过对比直的和弯曲的微米线上TE和TM偏振的光谱,观察到了弯曲氧化锌微米线中不同位置的回音壁模式的移动,其机理是在弯曲应力作用下激子能级发生了移动,带边附近的介电常数也随之变化,导致微腔中的回音壁模式发生移动.
In this paper, we use the micro-confocal fluorescence microscopy to measure the spectra of different positions on the micro-wires perpendicular to the c-axis of the ZnO micro-wires. By comparing the spectra of the TE and TM polarizations on the straight and curved micro-wires, The movement of whispering gallery modes at different positions in zinc micron wire is caused by the shift of the exciton energy level under the bending stress and the change of the dielectric constant around the strip edge, resulting in the whispering gallery mode in the microcavity mobile.