论文部分内容阅读
ｐ 偏振光在镀膜平板玻璃上、下表面反射光强比γ的角度调制曲线的性状与膜层光学参数密切相关。分析了γ与膜层折射率、消光系数及膜厚的相对梯度随光学参数变化的关系， 为基于ｐ 偏振光双面反射的薄膜传感器选择最佳参数提供了理论依据， 计算表明该类型传感器对膜层折射率的测量分辨率高达１０－ ７。对不同工艺条件下得到的溶胶－凝胶ＳｎＯ２ 膜进行光学参数测定及初步气敏实验， 结果表明ｐ 偏振光双面反射可作为高灵敏度光化学传感器的检测方法。
The p-polarized light on the coated glass, the lower surface of the reflected light intensity ratio γ angle modulation curve characteristics and the optical parameters of the film is closely related. The relationship between the relative gradient of γ and the refractive index, extinction coefficient and film thickness of the film is analyzed with the change of the optical parameters, which provides the theoretical basis for the selection of the optimal parameters of the thin film sensor based on the p-polarized double reflection. The calculation shows that this type of sensor pairs Film refractive index measurement resolution up to 10-7. The optical parameters and initial gas sensitization experiments of sol-gel SnO2 films obtained under different process conditions show that p-polarized double-sided reflection can be used as the detection method of high-sensitivity photochemical sensors.