报道了一种针对X射线转换晶体光学性能综合测试的光电检测方法。从效能角度对测试装置进行优化,对系统固有的工频干扰与尖峰脉冲噪声采取了有效抑制措施。利用该装置测试了山西长城微光器材股份有限公司研制的某未知闪烁晶体的可见光光谱响应、光学转换效率、空间分辨率等性能。研究的光电综合测试方法为闪烁晶体材料的研制提供了一种性能测试借鉴。 A photoelectric detection method for the comprehensive testing of the optical properties of X-ray crystal is reported. From the efficiency point of view of the test device optimization, the system of the inherent frequency interference and spike noise to take effective measures to suppress. The device was used to test the spectral response, optical conversion efficiency and spatial resolution of an unknown scintillation crystal developed by Shanxi Great Wall Microlight Co., Ltd. The optoelectronic integrated test method provided for the development of scintillation crystal materials provides a performance test reference.