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本文提出了一种测量子电路参数的新方法 .通过将待测子电路的影响视为系统误差 ,再经过校准过程而消除之 .此方法无需拆下子电路 ,因此精度高 ,操作简便 .
In this paper, a new method of measuring the parameters of sub-circuits is proposed, which is eliminated by considering the influence of sub-circuits to be tested as system errors and then calibrating the circuits. This method does not need to remove the sub-circuits and therefore has high precision and easy operation.