用X射线光电子能谱研究了Sm掺杂的固态C60相衍变和芯电子态.在SmxC60中Sm的含量x小于0.5时,样品是固溶相;在x=0.5和x=2.75之间的掺杂阶段,样品是这两个相的混合.在x=2.75和x=6之间的高掺杂阶段未观察到相分离的X射线光电子能谱证据.Sm4f,4d的实验数据表明Sm的价态是+2.二价Sm3d52芯态谱线存在两个子峰. X-ray photoelectron spectroscopy was used to study the solid-state C60 phase transformation and core electronic states of Sm-doped samples. The solid solution phase was obtained when the content of Sm was less than 0.5 in SmxC60. When the content of Sm was between x = 0.5 and x = 2.75 In the heterogeneous phase, the sample is a mixture of these two phases.X-ray photoelectron spectroscopy evidence of phase separation is not observed in the high-doping phase between x = 2.75 and x = 6. The experimental data of Sm4f, 4d show that the valence of Sm State is +2. There are two sub-peaks in the bivalent Sm3d52 core line.