前言近些年来,对微处理器的功能测试提出了许多方法。然而,具体采用哪些方法和编制怎样的功能测试程序,是与测试场合和测试工具密切相关的。如下表所示,测试场合是指测试部门和测试阶段,而测试工具包括测试设备的软件和硬件。显然,测试场合决定测试要求,测试工具决定测试能力。这些都是决定测试方法的重要因素。本文是针对8085A成品的性能鉴定测试、在缺少测试软件的测试系统上所做的工作。一、测试程序的结构微处理器的鉴定测试(亦称工程评价),是为了鉴定与检验其性能指标是否满足设计要求而进行的测试。该测试不仅包括动态功能测试,而且包括全部直流参数测试、主要交流参数测试、工作界限(即Shmoo(图)测试。总测试流程(未含交流参数测试和工作界限测试两部分,如图1所示。 1.动态功能测试动态功能测试,是在额定负载和规定输 Preface In recent years, many methods have been proposed for functional testing of microprocessors. However, which methods are used and how to prepare functional test programs are closely related to test situations and test tools. As shown in the following table, the test scenario refers to the test department and the test phase. The test tool includes the software and hardware of the test device. Obviously, test occasions determine test requirements, test tools determine test capabilities. These are important factors that determine the test method. This article is for the 8085A finished product performance testing, testing software in the absence of the test system to do the work. First, the structure of the test program Microprocessor identification test (also known as engineering evaluation), is to identify and test its performance indicators to meet the design requirements of the test. The test includes not only the dynamic function test but also all the DC parameter tests, the main AC parameter test and the working limit (ie Shmoo test). The total test flow (excluding the AC parameter test and the work limit test, as shown in Figure 1 1. Dynamic function test Dynamic function test is the rated load and the specified input