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合肥X射线衍射光束线装备了一台以两晶体无色散 ( +n ,-n)排列 ,能量可连续扫描 ,空间位置固定输出为特点的双晶单色仪。选用单晶硅作为分光元件 ,它所对应的不同能量产生的全反射的本征宽度决定了双晶单色仪的分辨率。因此 ,晶体在投入使用之前 ,测量它的本征宽度 ,为单色仪的调试提供依据是非常必要的。介绍了用于合肥X射线衍射光束线单色仪中两块晶体的测量 ,包括测试方法、装置、测量结果和分析。
Hefei X-ray diffraction beamline equipped with a two crystals without dispersion (+ n, -n) arrangement, the energy can be continuously scanned, the spatial position of a fixed output twin-crystal monochromator. Monocrystalline silicon is selected as the light splitting element, and the intrinsic width of the total reflection produced by different energy sources determines the resolution of the twin monocrystal. Therefore, the crystal before it is put into use, measure its intrinsic width, it is very necessary to provide a basis for the monochromator debugging. The measurement of two crystals used in the monochromator of X - ray diffraction beamline in Hefei is introduced, including the test method, device, measurement results and analysis.