论文部分内容阅读
为了研究了PIN二极管电热学效应,通过T-CAD软件建立PIN二极管的电热学模型,模拟了PIN二极管的瞬态特性。研究了PIN二极管器件脉冲电压下的电热特性,分析了PIN二极管的载流子浓度与温度的关系,模拟得到了不同载流子浓度下与瞬态响应曲线、得到了与器件内部温度的关系。模拟结果表明:随着载流子浓度增大,器件内部温度增长越快,器件达到失效状态的时间越短。
In order to study the thermoelectric effect of PIN diode, the thermoelectric model of PIN diode was established by T-CAD software to simulate the transient characteristics of PIN diode. The characteristics of the PIN diode under pulsed voltage were studied. The relationship between the carrier concentration and the temperature of the PIN diode was analyzed. The transient response curves at different carrier concentrations were simulated. The relationship between the temperature and the internal temperature of the device was obtained. The simulation results show that as the carrier concentration increases, the faster the internal temperature of the device increases, the shorter the device reaches the failure state.