使用探针式表面光洁度测定仪来测定胶料表面粗糙度的做法已有多年历史 ,其中Ｓ型探针式表面光洁度测定仪是以 1根细针在试样表面作来回逐行擦拭探测 ,然后把所得凹凸度加以测评作为测试原理的。但过去所用的绝大多数这类仪器只能作单轴的线性探测 ,从而仅能提供一维粗糙度 ,而 The use of a probe surface finish tester to measure the surface roughness of a rubber compound has been around for many years. The S-probe surface finish tester uses a thin needle to perform a line-by-line wipe test on the surface of the test specimen and then The resulting bump to be tested as a test principle. However, the vast majority of such instruments used in the past were only capable of linear uniaxial probing to provide only one-dimensional roughness, whereas