本文试图采用内建自测逻辑(BIST—Built—In Self Testing)的结构化可测设计方法解决 VLSI 的自动测试问题。给出了 RAM 的错误模型及测试方法。用 Concorde硅编译器工具设计和模拟了一个512位静态 RAM 的内建自测电路。对于容量大于4K 的 RAM,BIST 方法将是一个便宜和有效的自动测试方法 This article attempts to solve the problem of VLSI auto-test by using structured and measurable design method of BIST-Built-In Self Testing. The RAM error model and test method are given. A 512-bit static RAM built-in self-test circuit was designed and simulated using the Concorde silicon compiler tool. The BIST method will be a cheap and effective automated test method for RAMs with capacities greater than 4K