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Y2001-62724-657 0117342应用取样压力探测的集成电路内波形的微微秒测量(2):应用、能力和局限性=Picoseconds measurement ofinternal waveforms in integrated circuits using sampling force probing(Ⅱ):applications,capabilities,& Limita-tions[会,英]/Said,R.A.//2000 IEEE InternationalSymposium on Circuits and Systems,Vol.2.—657～660(HC)Y2001-62724-665 0117343VLSI电路定时驱动伪穷举测试=A timing-drivenpseudo-exhaustive testing of VLSI circuits[会,英]/Chang,S.C.& Rau,J.C.//2000 IEEE InternationalSymposium on Circuits and Systems,Vol.2.—665～668(HC)
Picoseconds measurement of internal waveforms in integrated circuits using sampling force probing (II): applications, capabilities, & applications. Picoseconds measurement of external waveforms in integrated circuits using sampling force probing (II): Applications, Capabilities, Limita-tions [/ b] / Said, RA // 2000 IEEE International Symposium on Circuits and Systems, Vol. 2.-657-660 (HC) Y2001-62724-665 0117343 VLSI Circuit Timing Driven Pseudo-Exhaustive Test = A timing- drivenpseudo-exhaustive testing of VLSI circuits [Chang, SC & Rau, JC // 2000 IEEE International Symposium on Circuits and Systems, Vol.2.-665-668 (HC)