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该文给出了一种微处理器浮点运算功能的测试方法，该方法的测试工作量少、测试时间短，而同时又具有较高的测试覆盖率。工程实践表明，该方法确实是一种可行的、有效的功能测试方法。
This paper presents a test method of microprocessor floating point function. This method has less testing workload, short testing time and high test coverage. Engineering practice shows that the method is indeed a viable and effective functional test method.