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为了快速、精确地定位红外光斑的二维空间位置,提出利用半导体制冷器(TEC)作为标定点源的红外成像仪隐式标定方法。首先采用高分辨率的可见光CCD相机和已知空间坐标的高精度网格,用直接线性变换标定法求得热源的高精度空间坐标,然后利用质心型增长法分割红外图像得到其中心亮点坐标,再求解出红外图像像素坐标与空间坐标之间的转换矩阵。实验研究表明:用探测器320×240,波段8～12μm的红外成像仪拍摄200 mm×100 mm的空间视场,使用直接线性法标定带有8个TEC的靶标,标定误差小于0.4 mm。该方法简单、精度高,为红外成像仪的二维标定探索了一种低成本、高精度的途径。
In order to quickly and accurately locate the two-dimensional spatial position of the infrared spot, an implicit calibration method of infrared imager using a semiconductor cooler (TEC) as a calibration point source is proposed. Firstly, a high-resolution visible CCD camera and a high-precision grid with known spatial coordinates are used to obtain the high-precision spatial coordinates of the heat source by using a direct linear transformation calibration method. Then, an infrared image is segmented by the centroid-type growth method to obtain the coordinates of the central bright spot, Then, the conversion matrix between the pixel coordinates and spatial coordinates of the infrared image is solved. Experimental results show that the space field of 200 mm × 100 mm is photographed with a 320 × 240 detector and an infrared imager with a wavelength of 8 ~ 12 μm. The target with 8 TECs is calibrated using the direct linear method. The calibration error is less than 0.4 mm. The method is simple and has high precision. It explores a low-cost, high-precision approach for the two-dimensional calibration of infrared imager.