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对具有金属 -半导体 -金属 (MSM)结构的 Cd Se探测器的噪声进行了实验观测 ,并对探测器中光生载流子的输运过程进行了分析 ,结果表明探测器的噪声是由从正极注入的空穴电流引起的 .因此只有改变正极接触 ,才能有效地阻止空穴注入 ,从而消除探测器噪声 .
The experiment on the noise of CdSe detector with metal-semiconductor-metal (MSM) structure was carried out and the transport of photo-generated carriers in the detector was analyzed. The results show that the noise of the detector is from the positive Injected hole current caused, so only change the positive contact, in order to effectively prevent hole injection, thereby eliminating the detector noise.