论文部分内容阅读
在液晶折射率小于衬底折射率的条件下,利用漏模技术测量液晶的折射率以及液晶盒的厚度。这种技术是利用漏波导的衬底辐射模式,激发的漏模产生从衬底辐射出的m线,将测量的相应耦合角代入已知方程,确定液晶盒的参数。
Under the condition that the refractive index of the liquid crystal is less than the refractive index of the substrate, the refractive index of the liquid crystal and the thickness of the liquid crystal cell are measured by the leaky mode technique. This technique utilizes the radiation pattern of the waveguide with the leaky waveguide. The excited leaky mode generates the m line radiated from the substrate. The corresponding coupling angle of the measurement is substituted into the known equation to determine the parameters of the liquid crystal cell.