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报道了由地矿部全反射Ｘ射线荧光光谱技术组研制的全反射Ｘ射线荧光（ＴＸＲＦ）分析仪。着重介绍了样机的全反射装置、分析特点、技术参数和应用验证，与国内外同类仪器主要技术指标进行对比表明，该样机主要技术指标基本上达到国际同类仪器水平。列出了２３个元素的检出限范围（００８～０９２ｎｇ），测定Ｓｒ的线性动态范围在３个数量级，对地气样品的分析结果与原子吸收光谱法相符。方法精密度好，水样测定中各元素的ＲＳＤ（ｎ＝５）小于１０％。
A Total Reflection X-Ray Fluorescence (TXRF) analyzer developed by the Department of Geology and Minerals TIRR spectroscopy was reported. The total reflection device, analysis features, technical parameters and application verification of the prototype are emphatically introduced. Comparing with the main technical indexes of the same type of instruments at home and abroad, the main technical indexes of the prototype basically reach the international level of the same kind of instruments. The detection limits of 23 elements (008 ~ 092ng) were listed. The linear dynamic range of Sr was determined to be three orders of magnitude. The analysis of ground gas samples was in accordance with that of atomic absorption spectrometry. The precision of the method was good. The RSD (n = 5) of each element in the water sample was less than 10%.