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中国电子学会测量与仪器学会举办的第一届半导体集成电路测试学术交流会于一九八○年九月三日至九日在江西庐山举行。到会代表108人,其中正式代表64人,列席代表44人。跨电子测量仪器、半导体集成电路、计算机技术三大专业领域,代表着科研、高等学校、工厂及有关领导部门等66个单位,大多数代表都是工程师、讲师、助理研究员职务的中年科技工作者。江西省电子局朱副局长参加了会议。
The first semiconductor IC test symposium organized by the Institute of Measurement and Instrumentation of the Chinese Society of Electronics was held in Lushan, Jiangxi Province from September 3 to September 1980. There will be 108 delegates, of whom 64 will be formally represented and 44 will be represented. Across three professional fields of electronic measuring instruments, semiconductor integrated circuits and computer technology, representing 66 units such as scientific research, colleges and universities, factories and relevant leading departments. Most of the delegates are middle-aged and scientific and technical work in the positions of engineers, lecturers and assistant researchers By. Deputy Director Zhu of Electronic Bureau of Jiangxi Province attended the meeting.