一、前言由于低能X线的广泛应用,以及许多有高速电子束发生的仪器和设备都伴随产生低能X线,因此,对低能X线的剂量测量和防护监测必须予以重视。但是,由于低能光子和物质相互作用的特点,有必要对低能X线的剂量测量进行专门的研究。本文将主要涉及低于100 kVp,特别是低于50kVp的X线剂量测量问题。低能光子主要通过光电效应与物质相互作 I. INTRODUCTION Due to the widespread use of low-energy X-rays and many instruments and devices that generate high-speed electron beams, low-energy X-rays are accompanied by low-energy X-rays. Therefore, low-energy X-ray dosimetry and protection monitoring must be emphasized. However, because of the interaction between low-energy photons and materials, it is necessary to do a special research on low-energy X-ray dose measurement. This article will mainly deal with X-ray dose measurement problems below 100 kVp, especially below 50 kVp. Low-energy photons mainly interact with substances through the photoelectric effect