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制冷型In Sb红外焦平面探测器工作时需降温至低温(80 K),器件在整个生命周期会经受从常温(300 K)到低温(80 K)的上千次高低温循环。针对该型探测器开展了高低温循环特性试验,测试和分析了上千次高低温循环过程中器件光电性能、杜瓦热负载和J-T制冷器特性的变化。试验结果表明,探测器可以经受至少2 000次高低温循环,并且探测率变化的幅度≤5.5%、响应率变化的幅度≤4.8%、盲元数未发生增加。研究结果为器件的工艺研发和改进提供了参考。
The cooled In Sb infrared focal plane detector operates down to a low temperature (80 K) while the device is undergoing thousands of cycles of high and low temperatures from room temperature (300 K) to low temperature (80 K) throughout its life cycle. The high and low temperature cycling characteristics test was carried out for this type of detector, and the changes of optoelectronic performance, dewar load and J-T cooler characteristics during the thousands of high and low temperature cycles were tested and analyzed. The test results show that the detector can withstand at least 2000 cycles of high and low temperature, and the rate of change of detection rate is less than 5.5%, the rate of change of response rate is less than or equal to 4.8% and the blind number does not increase. The results provide a reference for the research and development of the device and the improvement of the device.