本文举例说明了应用透镜成像型高分辨电镜技术观察固溶体中析出物的三种方法：其一，用高分辨电镜技术观察Ｇ．Ｐ．区及其周围的原子排列和Ｇ．Ｐ．区向新相的转变过程；其二，利用Ｘ射线能谱技术观察到在Ｃｕ的层错上析出的Ｓｉ原子列和Ｔｉ－Ｍｏ合金中析出的ω相。其三是利用选择能量的高分辨电镜术观察Ａｌ－Ｓｉ合金中Ｓｉ析出物的原子像。本文对在原子分辨水平观察固溶体中析出物的方法进行了比较与讨论 This article illustrates three methods of using lens-based high-resolution electron microscopy to observe precipitates in solid solutions: First, G is observed by high-resolution electron microscopy. P. The atomic arrangement and G around and around the area. P. Region to the new phase of the transformation process; Second, the use of X-ray energy spectrum technology was observed in the Cu layer stacking on the precipitation of Si atoms in the column and Ti-Mo alloy precipitation ω phase. The third one is the observation of the atomic images of Si precipitates in Al-Si alloys by high-resolution electron microscopy with selective energy. In this paper, the method of observing the precipitates in solid solution at the atomic resolution level is compared and discussed