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前言固体微粒的X射线物相分析,可用以研究合金、矿物、颜料、空气或水里的污染粒子以及其它晶体微粒。在通常的实验条件下,使用X射线照相法能测定直径约在十微米(相当于微微克数量级)的单个固体微粒。但是在研究混合物样品的微粒时,困难就较大一些。由于样品中待测物质的量较少,信息微弱,所摄取的底片中往往只能显示一小部分衍射线条,而且,各组分的衍射线还可能重迭干扰。这些不利因素都会影响分析的结果。
Introduction X-ray phase analysis of solid particles can be used to study contaminated particles in alloys, minerals, pigments, air or water, and other crystalline particles. Under ordinary experimental conditions, x-ray radiography can be used to determine single solid particles about 10 microns in diameter (corresponding to the order of picograms). However, it is more difficult to study the particles of a mixture sample. Due to the small amount of material to be tested in the sample, the information is weak, only a small fraction of the diffraction lines are often taken in the negatives taken up, and the diffraction lines of the components may also interfere with each other. These unfavorable factors will affect the results of the analysis.