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研制的质子束流测量系统，本底电流仅为１０－ １４Ａ 量级，可测最大电流达ｍ Ａ 量级。在质子单粒子效应实验中，测得了ｐＡ 量级的质子束流及其随时间变化的关系，为半导体器件单粒子翻转截面的计算提供了必需的数据。
Developed proton beam measurement system, the background current is only 10- 14A magnitude, the maximum current measured up to m A magnitude. In proton singlet effect experiments, we measured the pA order of proton beams and their relationship with time, providing the necessary data for the calculation of the single-element inversion section of semiconductor devices.