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一、前言国际电工委员会(IEC)第48届年会于1983年10月17日至29日在日本东京举行。会议期间除理事会、执委会以外,还有29个技术委员会(TC)和分技术委员会(SC)举行了会议。出席48届年会的有36个国家近千名代表和工作人员。中国派出了以国家标准局为首的,有机械部、电子部、航天部、水电部、邮电部、轻工部、医疗器械总公司等28人代表团参加了IEC48届东京年会。并参观了日本的一些工厂、研究所和试验基地。笔者参加了10月18日至21日召开的低压熔断器分技术委员会(SC32B)会议;10月24日至25日召开的高压熔断器分技术委员会(SC32
I. Preface The 48th annual meeting of the International Electrotechnical Commission (IEC) was held in Tokyo, Japan from October 17th to 29th, 1983. During the meeting, in addition to the council and the executive committee, there were 29 technical committees (TCs) and sub-technical committees (SCs) held meetings. Nearly a thousand representatives and staff from 36 countries attended the 48th annual meeting. China sent a delegation of 28 people including the Ministry of Machinery, Electronics, Aerospace, the Ministry of Water and Electricity, the Ministry of Posts and Telecommunications, the Ministry of Light Industry, and the Medical Device Corporation to the IEC 48th Tokyo Annual Meeting. And visited some factories, research institutes and test sites in Japan. The author participated in the Low Voltage Fuse Sub-Technical Committee (SC32B) meeting held from October 18th to 21st; the High Voltage Fuse Sub-Technical Committee (SC32) held from October 24th to 25th.