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对用于寬頻带增音同軸海底电纜电話系統的半导体器件,1960年初,貝尔系統就开始了研究工作。在改变这些器件的工作能力方面,研究一直持續至今天。过十年之后,現在第一个安装的系統已經成功地工作了五年多;一个横跨大西洋的系統正在工作,而另外几个相等的或更长的系統处在不同阶段的鋪設之中。用于这些系統的所有器件都进行了类似实驗室的寿命鑑定实驗,第一种系統中所用的五种有代表性的100个器件,經历了长达七年之久的寿命实驗。我們发現,不管是在使用中还是在寿命鉴定实驗中,器件都沒失效,因此确认比五种有代表性的器件要好的元件失效率FIT。而且,老化了七年的有代表性的样品的变化数据表明所确定的FIT这个失效率是非常保守的。在低于击穿的条件下老化过的硅二极管,要比为鉴定它們的可靠性而設計的寿命实驗系統所老化的稳定得多。在击穿条件下老化的硅二极管,它的漏电流呈現綫性漂移,这个漏电流非常小,以至于除非用极灵敏的測試系統是不可能发現的。通过同样过程鉴定锗三极管表明,它們所呈現出的电流增益的变化明显地小于研究开始时为它們所規定的指标。为一种新的高性能系統正在研制的硅三极管,完全有希望超过更广泛鉴定过的锗器件的稳定性。这些結果仅与海底电纜系統的性能有关,而且有更广泛的含义,因为它們表明,长期以来被认为是半导体器件所固有的这种可靠性,不仅定量地令人信服地实現了,而且可以被认为对未来系統的应用是理想的。
In the early 1960s, Bell Systems began research work on the semiconductor devices used for wideband, amplified coaxial cable telephone systems. Research has continued to change the capabilities of these devices. After ten years, the first system installed now has been successfully working for more than five years; one transatlantic system is working and several others, equal or longer, are in different stages of laying. All of the devices used in these systems perform lab-like life-time lab experiments, and the five representative 100 devices used in the first system went through a seven-year life test. We found that the device did not fail in both in-service and lifetime assays, thus confirming component failure FIT better than the five representative devices. Moreover, the change data of representative samples aged for seven years show that the failure rate of FIT is very conservative. Silicon diodes that are aged below breakdown are much more stable than aging test systems designed to verify their reliability. Aging silicon diodes under breakdown conditions exhibit a linear drift in leakage current that is so small that it can not be found unless a very sensitive test system is used. The same process of identifying the germanium transistors shows that they exhibit significantly less current gain changes than they were specified at the beginning of the study. The silicon transistors under development for a new high-performance system are entirely promising beyond the stability of the more widely-identified germanium devices. These results relate only to the performance of submarine cable systems and are broader in their meaning as they indicate that this reliability, long believed to be intrinsic to semiconductor devices, is not only quantitatively convincingly achieved, It is considered ideal for future system applications.