In this study, using a comprehensive numerical simulation of charge and discharge processes, we investigate the formation and evolution of negative charge and discharge characteristics of a grounded PMMA film irradiated by a non-focused electron beam. Electron scattering and transport processes in the sample are simulated with the Monte Carlo and the finite-different time-domain (FDTD) methods, respectively. The properties of charge and discharge processes are presented by the evolution of inteal currents, charge quantity, surface potential, and discharge time. Inteal charge accumulation in the sample may reach saturation by primary electron (PE) irradiation providing the charge duration is enough. Inteal free electrons will run off to the ground in the form of leakage current due to charge diffusion and drift during the discharge process after irradiation, while trapped electrons remain. The negative surface potential determined by the charging quantity decreases to its saturation in the charge process, and then increases in the discharge process. A larger thickness of the PMMA film will result in greater charge amount and surface potential in charge saturation and in final discharge state, while the electron mobility of the material has little effects on the final discharge state. Moreover, discharge time is less for smaller thickness or larger electron mobility. The presented results can be helpful for estimating and weakening the charging of insulating samples especially under the intermittent electron beam irradiation in related surface analysis or measurement.